XH GST417W Wafer-Level Uncooled Infrared Detector
XH GST417W Wafer-Level Uncooled Infrared Detector - 图片 2

XH GST417W Wafer-Level Uncooled Infrared Detector

Designed for Emerging Markets and Mass Adoption

The GST417W features a 400×300 resolution and 17 μm pixel pitch, offering an excellent balance of performance and integration flexibility.
Wafer-level vacuum packaging enables seamless integration into thermal imaging devices for temperature measurement and night vision applications.

Resolution: 400 × 300

Pixel Pitch: 17 μm

Spectral Range: 8–14 μm

Typical NETD: < 40 mK

分类：
Product Features

Clear Imaging with High Sensitivity

400×300 focal plane array
Typical NETD < 40 mK

Lightweight Design

Compact size: 18×16×2.75 mm (excluding connector)
Ultra-light weight: < 2 g

Consumer-Grade Applications

Suitable for large-scale deployment

Applications
  • Temperature Measurement & Inspection
    Temperature Measurement & Inspection
  • Security Monitoring
    Security Monitoring
  • UAV Payload
    UAV Payload
  • Night Vision Observation
    Night Vision Observation
Technical Specifications
Product ModelGST417W Uncooled Infrared Detector
Sensitive MaterialVanadium Oxide (VOx)
Array Format400×300
Pixel Pitch17μm
Spectral Range8-14μm
Typical NETD<40mK
Output SignalBuilt-in 14-bit ADC
Thermal Response Time<12ms
Maximum Frame Rate50Hz
Power Consumption≤180mW
Dimensions (mm)18×16×2.75 (excluding interface)
Weight<2g
Operating Temperature-40°C ~ +85°C

 

评价

目前还没有评价

成为第一个“XH GST417W Wafer-Level Uncooled Infrared Detector” 的评价者

您的邮箱地址不会被公开。 必填项已用 * 标注

相关产品

Inquiry Form:

Please enter your full name.
This field is required.
Optional: Your phone number for a quicker response.
This field is required.
Enter the name of the product you are inquiring about.
This field is required.
Please provide details about your inquiry.
This field is required.
购物车